This paper is published in Volume-7, Issue-1, 2021
Area
Engineering
Author
Chiranjeevi Aradhya
Org/Univ
Collins Aerospace, Charlotte, North Carolina, USA, United States of America
Pub. Date
27 January, 2021
Paper ID
V7I1-1165
Publisher
Keywords
Embedded System Robustness, Robustness Testing, Robustness Testing Tools

Citationsacebook

IEEE
Chiranjeevi Aradhya. A detailed survey and evaluation of various aspects of embedded software robustness testing, International Journal of Advance Research, Ideas and Innovations in Technology, www.IJARIIT.com.

APA
Chiranjeevi Aradhya (2021). A detailed survey and evaluation of various aspects of embedded software robustness testing. International Journal of Advance Research, Ideas and Innovations in Technology, 7(1) www.IJARIIT.com.

MLA
Chiranjeevi Aradhya. "A detailed survey and evaluation of various aspects of embedded software robustness testing." International Journal of Advance Research, Ideas and Innovations in Technology 7.1 (2021). www.IJARIIT.com.

Abstract

The focus of the current and future automotive, multimedia, and industrial automation systems is embedded software. The reliability of the embedded software system determines the performance of virtually every industrial application; one approach for determining a system's reliability is to measure its robustness. The aim of this paper is to provide a framework to understand the existing state-of-the-art practice in the robustness testing of built-in software systems. In robustness tests from different industrial domains, I've collected details on the state of practice on telecommunication, automotive, multimedia, critical infrastructure, aerospace, consumer products, and banking. I investigate various aspects of robustness testing, such as the general view of robustness, engineering, and design of specifications, test results, failure, and equipment. I emphasize the state of understanding of the robustness testing practice of integrated software systems. The survey outlines many ad-hoc techniques, including power failure and overload situations. Other discrepancies I found concern the classification of robustness defects, the assumed root causes of robustness defects, and the types of devices for testing robustness. This article is an initial step in the evaluation of the robustness testing practice of embedded software systems.