Digital multipliers have many numbers of DSP applications. The overall performance leans on the output of the multiplier. When we apply a negative bias to the PMOS transistor, there occurs temperature instability. The minimum voltage at which the PMOS transistor is ON will be increased whereas it decreases the multiplier speed. Similarly, if we apply a positive bias to the NMOS transistor, temperature instability occurs.This degrades the transistors speed and the system fails because there is a violation in time. There exists an aging-aware multiplier with adaptive hold logic (AHL) circuit. This circuit provides higher throughput through the variable latency. In the existing method, Row or Column bypassing is done to reduce the aging effect. Our desired structure is that we are bypassing column and row together so that the throughput can be increased. We are implementing our advanced design in real time applications like FIR filters.