This paper is published in Volume-7, Issue-4, 2021
Area
Semiconductor Manufacturing
Author
Nandini G., K. G. Ashwin Krishnan, Harshith R., Dileep Kumar Simhadri, Gummalla Akhil Kumar Reddy
Org/Univ
Rajarajeswari College of Engineering, Bengaluru, Karnataka, India
Keywords
Semiconductor, Manufacturing, Equipment's, Delicate, Machine Learning, Algorithms
Citations
IEEE
Nandini G., K. G. Ashwin Krishnan, Harshith R., Dileep Kumar Simhadri, Gummalla Akhil Kumar Reddy. Identifying defects during semiconductor manufacturing using Machine Learning, International Journal of Advance Research, Ideas and Innovations in Technology, www.IJARIIT.com.
APA
Nandini G., K. G. Ashwin Krishnan, Harshith R., Dileep Kumar Simhadri, Gummalla Akhil Kumar Reddy (2021). Identifying defects during semiconductor manufacturing using Machine Learning. International Journal of Advance Research, Ideas and Innovations in Technology, 7(4) www.IJARIIT.com.
MLA
Nandini G., K. G. Ashwin Krishnan, Harshith R., Dileep Kumar Simhadri, Gummalla Akhil Kumar Reddy. "Identifying defects during semiconductor manufacturing using Machine Learning." International Journal of Advance Research, Ideas and Innovations in Technology 7.4 (2021). www.IJARIIT.com.
Nandini G., K. G. Ashwin Krishnan, Harshith R., Dileep Kumar Simhadri, Gummalla Akhil Kumar Reddy. Identifying defects during semiconductor manufacturing using Machine Learning, International Journal of Advance Research, Ideas and Innovations in Technology, www.IJARIIT.com.
APA
Nandini G., K. G. Ashwin Krishnan, Harshith R., Dileep Kumar Simhadri, Gummalla Akhil Kumar Reddy (2021). Identifying defects during semiconductor manufacturing using Machine Learning. International Journal of Advance Research, Ideas and Innovations in Technology, 7(4) www.IJARIIT.com.
MLA
Nandini G., K. G. Ashwin Krishnan, Harshith R., Dileep Kumar Simhadri, Gummalla Akhil Kumar Reddy. "Identifying defects during semiconductor manufacturing using Machine Learning." International Journal of Advance Research, Ideas and Innovations in Technology 7.4 (2021). www.IJARIIT.com.
Abstract
This Project is about identifying defects in the equipment that manufactures semiconductors by using various required parameters. Semiconductor manufacturing is a very delicate process and all the equipment that manufactures semiconductors needs to function properly, and any error in this equipment will cause major damage to the manufacturing process. In this project, we have used various machine learning algorithms and implemented the best one which has more accuracy in identifying defects during the manufacturing of semiconductors.
