This paper is published in Volume-10, Issue-5, 2024
Area
Computer Science And Engineering
Author
Makineni Saroj Vihung, Kanduri Sahith, Baddam Rithika Reddy, Samala Keerthi, Savarapu Omkaarini, Thirupathi Nanuvala
Org/Univ
Vallurupalli Nageswara Rao Vignana Jyothi Institute of Engineering &Technology, Hyderabad, India
Keywords
Face Recognition, Multi-Face Detection, Haar Cascade Classifier, FaceNet Model, Anti-Spoofing, Convolutional Neural Network (CNN), Attendance System, Machine Learning, Computer Vision, Image Processing, Real-Time Processing
Citations
IEEE
Makineni Saroj Vihung, Kanduri Sahith, Baddam Rithika Reddy, Samala Keerthi, Savarapu Omkaarini, Thirupathi Nanuvala. Streamlined Attendance Monitoring : Multifaced Recognition, International Journal of Advance Research, Ideas and Innovations in Technology, www.IJARIIT.com.
APA
Makineni Saroj Vihung, Kanduri Sahith, Baddam Rithika Reddy, Samala Keerthi, Savarapu Omkaarini, Thirupathi Nanuvala (2024). Streamlined Attendance Monitoring : Multifaced Recognition. International Journal of Advance Research, Ideas and Innovations in Technology, 10(5) www.IJARIIT.com.
MLA
Makineni Saroj Vihung, Kanduri Sahith, Baddam Rithika Reddy, Samala Keerthi, Savarapu Omkaarini, Thirupathi Nanuvala. "Streamlined Attendance Monitoring : Multifaced Recognition." International Journal of Advance Research, Ideas and Innovations in Technology 10.5 (2024). www.IJARIIT.com.
Makineni Saroj Vihung, Kanduri Sahith, Baddam Rithika Reddy, Samala Keerthi, Savarapu Omkaarini, Thirupathi Nanuvala. Streamlined Attendance Monitoring : Multifaced Recognition, International Journal of Advance Research, Ideas and Innovations in Technology, www.IJARIIT.com.
APA
Makineni Saroj Vihung, Kanduri Sahith, Baddam Rithika Reddy, Samala Keerthi, Savarapu Omkaarini, Thirupathi Nanuvala (2024). Streamlined Attendance Monitoring : Multifaced Recognition. International Journal of Advance Research, Ideas and Innovations in Technology, 10(5) www.IJARIIT.com.
MLA
Makineni Saroj Vihung, Kanduri Sahith, Baddam Rithika Reddy, Samala Keerthi, Savarapu Omkaarini, Thirupathi Nanuvala. "Streamlined Attendance Monitoring : Multifaced Recognition." International Journal of Advance Research, Ideas and Innovations in Technology 10.5 (2024). www.IJARIIT.com.
Abstract
In order to precisely discover human beings, conventional attendance structures normally depend on biometric techniques like fingerprint or iris scanning. But these systems frequently have scalability and performance problems, especially while handling large companies straight away. This research gives a novel technique to decorate attendance monitoring through using ultra-modern multi-face popularity techniques. In assessment to conventional biometric systems which are commonly restricted to unmarried user processing, our device can effortlessly control several customers immediately. It makes use of a combination of several algorithms to detect spoofing, become aware of faces, and perform excessive-precision recognition. By integrating these techniques, the system overcomes common issues associated with traditional techniques, such as false identities and unauthorized access, and provides a robust solution provide accurate and reliable attendance records This method not only provides accurate and speedy attendance tracking but also ensures the integrity of the process Becoming an ideal solution for environments that require biometric identification systems.