This paper is published in Volume-5, Issue-3, 2019
Area
Computer Science
Author
Sudeep Ghosh, Mandira Banik, Tridib Chakraborty, Niraj Pandey
Org/Univ
Gurunanak Institute of Technology, Kolkata, West Bengal, India
Pub. Date
07 June, 2019
Paper ID
V5I3-1763
Publisher
Keywords
3D IC, TSV, SICs

Citationsacebook

IEEE
Sudeep Ghosh, Mandira Banik, Tridib Chakraborty, Niraj Pandey. TSV based 3D-SIC Testing, International Journal of Advance Research, Ideas and Innovations in Technology, www.IJARIIT.com.

APA
Sudeep Ghosh, Mandira Banik, Tridib Chakraborty, Niraj Pandey (2019). TSV based 3D-SIC Testing. International Journal of Advance Research, Ideas and Innovations in Technology, 5(3) www.IJARIIT.com.

MLA
Sudeep Ghosh, Mandira Banik, Tridib Chakraborty, Niraj Pandey. "TSV based 3D-SIC Testing." International Journal of Advance Research, Ideas and Innovations in Technology 5.3 (2019). www.IJARIIT.com.

Abstract

Three Dimensional Integrated Circuits (3D IC) have been getting attention among researchers and IC designers as an emerging technology to help overcome the interconnect delay and power limitations. Tight integration of multiple silicon tiers using vertical 3D vias as interconnect offers a better functioning of 3D-ICs. In this work, we focus on 3D-SICs implemented using Through- Silicon Via (TSV) vertical interconnects. Through strategic modification of the architectures to take advantage of 3D, significant improvement in the functioning can be achieved.